Toshihiro
Tsuji
Research Associate,
Doctor of Philosophy in Engineering
Department of Materials Processing,
Research
Area
- Materials
evaluation
- Scanning probe
microscopy
○Profile 1998.３ BE
Degree, Department of Material Processing, Tohoku University
2000.３ ME
Degree, Department of Material Processing, Graduate School of Engineering,
Tohoku University
2003.3 PhD
Degree, Department of Material Processing, Graduate
2003.４ JSPS
Research Fellow PD, Mechanical Engineering Department, National Institute of Advanced
Industrial Science and Technology
2004.4 Research
Associate, Department of Materials Processing, Graduate
○Degree： Doctor
of Philosophy in Engineering （Tohoku University, 2003.3）
“Elasticity
Evaluation Method on Nanoscale by Ultrasonic Atomic Force Microscopy”
○Research: 1997～2005 R&D
of Material Evaluation Technology by Ultrasonic Atomic Force Microscopy
・
NDE of damaged layer on Si wafer
・
Evaluation of surface defect on nanoscale
・
Analysis of dislocation in layered crystals
・
Analysis of piezo/ferroelectric materials
Major papers (also in List of Papers)
¨
Evaluation of domain boundary of piezo/ferroelectric
material by ultrasonic atomic force microscopy, Tsuji T, Ogiso H, Akedo J,
Saito S, Fukuda K, Yamanaka K, Jpn. J. Appl. Phys. 43 (5B): 2907-2913 (2004)
¨
Imaging and evaluation of nano-scale crack by using
ultrasonic atomic force microscopy, Tsuji T, Irihama H, Mihara T, Yamanaka K,
KEY ENGINEERING MATERIALS 261-263, 1067-1072 (2004)
¨
Sharpening
contact resonance spectra in UAFM using Q-control, Fukuda K, Irihama H, Tsuji
T, Nakamoto K, Yamanaka K, SURFACE SCIENCE 532: 1145-1151 (2003).
¨
Observation of dislocation behavior in graphite by
using ultrasonic atomic force microscopy, Tsuji T, Irihama H, Yamanaka K, JSME Int. J. Ser. A-SOLID MECHANICS AND
MATERIAL ENGINEERING 45 (4): 561-566 (2002).
¨
Observation of anomalous dislocation behavior in
graphite using ultrasonic atomic force microscopy, Tsuji T, Irihama H, Yamanaka
K, Jpn. J. Appl. Phys. 41 (2A): 832-835 (2002).
¨
Observation by ultrasonic atomic force microscopy of
reversible displacement of subsurface dislocations in highly oriented pyrolytic
graphite, Tsuji T, Yamanaka K, NANOTECHNOLOGY 12 (3) 301-307 (2001).
¨
Resonance frequency and Q factor mapping by ultrasonic
atomic force microscopy, Yamanaka K, Maruyama Y, Tsuji T, Nakamoto K, Appl.
Phys. Lett. 78 (13) 1939-1941 (2001).
¨
Quantitative material characterization by ultrasonic
AFM, Yamanaka K, Noguchi A, Tsuji T, Koike T, Goto T, SURFACE AND INTERFACE
ANALYSIS 27 (5-6): 600-606 (1999).
Tel:
81-22-795-7359
Fax: 81-22-795-4298
e-mail: t-tsuji@material.tohoku.ac.jp
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